{"id":36082,"date":"2017-07-01T23:44:12","date_gmt":"2017-07-01T23:44:12","guid":{"rendered":"https:\/\/silvaco-stage.betagentechnologies.com\/%e6%9c%aa%e5%88%86%e7%b1%bb\/calculating-failures-in-time-rates-for-finfet-circuits-using-tcad\/"},"modified":"2021-10-13T09:50:46","modified_gmt":"2021-10-13T16:50:46","slug":"calculating-failures-in-time-rates-for-finfet-circuits-using-tcad","status":"publish","type":"post","link":"https:\/\/silvaco-stage.betagentechnologies.com\/zh-hans\/calculating-failures-in-time-rates-for-finfet-circuits-using-tcad\/","title":{"rendered":"Calculating Failures In Time Rates for FinFET Circuits Using TCAD"},"content":{"rendered":"<h1>Calculating Failures In Time Rates for FinFET Circuits Using TCAD<\/h1>\n<p><strong>1.0 Introduction<\/strong><\/p>\n<p>In a previous article in Simulation Standard article entitled \u201cSoft Error Simulations\u201d, we discussed various ways to simulate soft errors using either TCAD, SPICE or a mixture of both. In this article we present a methodology for obtaining the Weibull function curve required for calculating the Failures In Time (FIT) rate of typical circuits in a reasonable time, using only TCAD simuations. This approach allows a true calculation of FIT rate by simulating incoming ionizing particles for any angle, location, and energy, in relation to devices in the circuit.<\/p>\n<p>By way of example, we shall use a ring oscillator circuit fabricated using a 7nm FinFET technology, but essentially any technology or circuit can be simulated using the techniques described here.<\/p>\n<p><img loading=\"lazy\" width=\"782\" height=\"1012\" src=\"https:\/\/silvaco-stage.betagentechnologies.com\/wp-content\/uploads\/2020\/02\/simstd_Q3_2017_a3-1.jpg\" class=\"cleaned-enfold-image\" alt=\"\" decoding=\"async\" loading=\"lazy\" srcset=\"https:\/\/silvaco-stage.betagentechnologies.com\/wp-content\/uploads\/2020\/02\/simstd_Q3_2017_a3-1.jpg 782w, https:\/\/silvaco-stage.betagentechnologies.com\/wp-content\/uploads\/2020\/02\/simstd_Q3_2017_a3-1-232x300.jpg 232w, https:\/\/silvaco-stage.betagentechnologies.com\/wp-content\/uploads\/2020\/02\/simstd_Q3_2017_a3-1-768x994.jpg 768w, https:\/\/silvaco-stage.betagentechnologies.com\/wp-content\/uploads\/2020\/02\/simstd_Q3_2017_a3-1-545x705.jpg 545w, https:\/\/silvaco-stage.betagentechnologies.com\/wp-content\/uploads\/2020\/02\/simstd_Q3_2017_a3-1-29x37.jpg 29w, https:\/\/silvaco-stage.betagentechnologies.com\/wp-content\/uploads\/2020\/02\/simstd_Q3_2017_a3-1-43x55.jpg 43w, https:\/\/silvaco-stage.betagentechnologies.com\/wp-content\/uploads\/2020\/02\/simstd_Q3_2017_a3-1-37x48.jpg 37w\" sizes=\"auto, (max-width: 782px) 100vw, 782px\" \/><\/p>\n","protected":false},"excerpt":{"rendered":"<p>In a previous article in Simulation Standard article entitled \u201cSoft Error Simulations\u201d, we discussed various ways to simulate soft errors using either TCAD, SPICE or a mixture of both. In this article we present a methodology for obtaining the Weibull function curve required for calculating the Failures In Time (FIT) rate of typical circuits in a reasonable time, using only TCAD simuations. This approach allows a true calculation of FIT rate by simulating incoming ionizing particles for any angle, location, and energy, in relation to devices in the circuit.<\/p>\n","protected":false},"author":5,"featured_media":19111,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[7723],"tags":[],"class_list":["post-36082","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-simulation-standard-zh-hans","entry","has-media"],"_links":{"self":[{"href":"https:\/\/silvaco-stage.betagentechnologies.com\/zh-hans\/wp-json\/wp\/v2\/posts\/36082","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/silvaco-stage.betagentechnologies.com\/zh-hans\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/silvaco-stage.betagentechnologies.com\/zh-hans\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/silvaco-stage.betagentechnologies.com\/zh-hans\/wp-json\/wp\/v2\/users\/5"}],"replies":[{"embeddable":true,"href":"https:\/\/silvaco-stage.betagentechnologies.com\/zh-hans\/wp-json\/wp\/v2\/comments?post=36082"}],"version-history":[{"count":1,"href":"https:\/\/silvaco-stage.betagentechnologies.com\/zh-hans\/wp-json\/wp\/v2\/posts\/36082\/revisions"}],"predecessor-version":[{"id":36084,"href":"https:\/\/silvaco-stage.betagentechnologies.com\/zh-hans\/wp-json\/wp\/v2\/posts\/36082\/revisions\/36084"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/silvaco-stage.betagentechnologies.com\/zh-hans\/wp-json\/wp\/v2\/media\/19111"}],"wp:attachment":[{"href":"https:\/\/silvaco-stage.betagentechnologies.com\/zh-hans\/wp-json\/wp\/v2\/media?parent=36082"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/silvaco-stage.betagentechnologies.com\/zh-hans\/wp-json\/wp\/v2\/categories?post=36082"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/silvaco-stage.betagentechnologies.com\/zh-hans\/wp-json\/wp\/v2\/tags?post=36082"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}