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State of the Art 3D SiC Process and Device Simulation

State of the Art 3D SiC Process and Device Simulation

Introduction

Silicon has long been the semiconductor of choice for high-voltage power electronics applications [1,2]. However, wide-bandgap semiconductors such as SiC have begun to attract attention because they are projected to have much better performance than silicon [3-7]. In comparison with silicon, wide-bandgap semiconductors offer a lower intrinsic carrier concentration (10 to 35 orders of magnitude), a higher electric breakdown field (4 to 20 times), a higher thermal conductivity (3 to 13 times), and a faster saturated electron drift velocity (2 to 2.5 times).

SiC exists in over 200 polytypes with different crystal structures with the same stoichiometry. However, only the 6H- and 4H-SiC polytypes are available commercially as both bulk wafers and custom epitaxial layers. Both of these polytypes have a hexagonal crystal structure and a bandgap in the neighborhood of 3eV. Of the two, 4H-SiC is now preferable due to the more isotropic nature of many of its electrical properties.